EV Isolation Kit（for Plasma & Serum)
EV Isolation Kit（for CCS & Urine)
TPX3Cam - fast optical camera for nanosecond photon time stamping
The TPX3Cam is a fast optical camera for time stamping of optical photons. It is based on a new silicon pixel sensor, which in combination with the Timepix3 ASIC and readout, is suitable for a wide range of applications which require time-resolved imaging of electrons, ions or single photons.
The TPX3Cam can be easily integrated both in tabletop lab setups, as in synchrotron or free-electron-laser environments.
Cheetah Detectors Camera for TEM ED
ASI’s Chee-tah is a hybrid pixel detector suitable for electron microscope applications. The Chee-tah’s sensitivity and speed offers unprecedented possibilities for electron diffraction, imaging and tomography.Each pixel is connected via bump-bonds to the readout electronics integrated in the chip below the sensor. The electronics in a pixel processes the signals from the sensor. An individual pixel counts the number of detected events in the corresponding area.Scintillated detectors don’t have the signal to noise ratio’s that can be obtained with the Chee-tah. Other direct electron cameras lack the dynamic range the Chee-tah has and are often too beam sensitive to be used for diffraction experiments. The Chee-tah’s high speed makes it ideal for looking at dynamic processes and catching fast fading signals.
2kN & 5kN Tensile compression and horizontal bending stage
MICROTEST 2kN & 5kN modules have been specifically designed to allow real time observation of the high stress region of a sample with an SEM, optical microscope, AFM or XRD system. Windows 7.0/10.0 software sets drive parameters and displays the stress/strain curve live on the computer screen. Loadcells from 150N to 5kN cover most applications, with extension rates from 0.005mm/min to 50mm/min. All stages have linear scales for elongation measurement and optical encoders for speed control. Options include three and four point bending clamps, fibre clamps and microscope mounting adaptors. Modules are controlled from Microtest tensile testing software and special versions can be manufactured to customers requirements.
Nanometer Pattern Generation System
The Nanometer Pattern Generation System is the top selling SEM lithography system at research institutions in North America and its use has become widespread around the world. The objective for NPGS is to provide a powerful, versatile, and easy to use system for doing advanced electron beam lithography or ion beam lithography using a commercial SEM (Scanning Electron Microscope), STEM (Scanning Transmission Electron Microscope), FIB (Focused Ion Beam), dual beam (SEM/FIB), or Helium Ion microscope(HIM).
Tergeo series tabletop plasma cleaners
EM-KLEEN etc remote plasma cleaner for SEM, FIB, XPS etc
For SEM, FIB, TEM, XPS, ALD , CD-SEM, EBR, EBI, EUVL and other high vacuum system. Remote plasma source should be installed on the vacuum chamber to be cleaned. Controller provides the RF power to the remote plasma source. RF energy breaks down the process gas that contains oxygen, hydrogen or other process gases and generates reactive radicals. Radical species will then diffuse into the chamber to be cleaned and react with the contaminants. The byproducts are usually low molecule weight, high vapor pressure molecules that can be easily pumped away. Remote plasma cleaner can clean vacuum systems and samples at the same time.
Multipurpose Chamber——TEM & SEM sample cleaning & storage solution
The multipurpose chamber can be configured for different applications with exter-nal accessories such as EM-KLEEN remote plasma source and/or TEM specimen holder adapters. EM-KLEEN remote plasma source can be used to generate oxygen & hydrogen radicals using air, O2, or H2 gas for sample cleaning and surface activa-tion. If the chamber is equipped with TEM specimen holder adapters, it can accept a total of six TEM specimen holders from Thermo-Fisher, JEOL, and Hitachi. Then it can be used as a vacuum storage station. Of course, EM-KLEEN plasma source can also be taken out and installed on a separate SEM, FIB or XPS chambers.
M2N electron microscope supplies and consumables are complete
Micro to Nano is a company specialised in innovative, practical and useful microscopy supplies for electron microscopy and scanning probe microscopy techniques. With a combined experience of over 50 years in electron microscopy, sample preparation, imaging technology and product distribution. M2N have a deep understanding of the needs of customers.
SEM Peltier stage system for in-situ heating & cooling
The Deben Coolstage can also be used for high vacuum heating and cooling applications inside the SEM.
The Deben Coolstage is available for all SEMs and guaranteed temperature range is +50°C to -25°C (at 300Pa chamber pressure) or less than -30°C at higher vacuums.
2kN & 5kN Dual leadscrew insitu tensile stage for XRD, Optical & Synchrotron
The dual leadscrew stage has been designed to allow both transmitted and reflected illumination and can be fitted to an optical microscope, XRD system or Synchrotron. Supplied with feet the stage can stand vertically like a conventional tensile tester or with the feet removed it will sit flat on a bench or optical microscope stage. Versions with maximum loading to 2kN or 5kN are available, with optional loadcells of 500N and 1kN. Sample clamps are removable allowing easy customisation and the fitting of special clamps for different samples. We can supply fibre clamps, three and four point bending clamps and clamps to hold specifically shaped specimens. Optionally the stage can be supplied with temperature controllers and either heated or heated and cooled specimen clamps with a variable temperature range of -150˚C to 550˚C.
LynX - Hybrid pixel detectors for X-ray
ASI’ s LynX detector series are hybrid pixel area detectors, with a pixel pitch of 55 µm,suitable for a wide range of applications.The capability of the LynX detectors to discriminate or measure energy of X-rays in each of its 512 x 512 pixels offers unprecedented possibilities for X-ray detection, imaging and tomography.LynX sensors (Si, GaAs, CdTe) are divided into an array of pixels and connected via bump-bonds to the readout electronics integrated in the chips below the sensor.
CT5000 5kN in-situ tensile stage for µXCT applications
In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile, compression and torsion stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Tansi.
Bi-axial & Quad-axial tensile stages
Deben can supply a range of different stages for Bi-axial and Quad-axial tensile testing. Whatever your requirements Deben have a solution for your application, we have a standard 2kN stage and can manufacture other custom systems with different forces from 50N up to 100kN.
2kN Tensile stage for SEM EBSD with optional heating
Deben have recently developed a new 2KN tensile stage with optional heating to 600°C specifically for use within an SEM with EBSD detector fitted. The stage has dual sample clamps allowing sample observation at 0° and 70° and can be fitted with optional heating/cooling jaws with temperature range up to 600°C.
SEM Probe Current Meter
A low-cost 3½-digit liquid crystal display readout of Electron Beam Probe Current. The free-standing meter is battery powered and measures from below 1pA to 2μA in 5 switched ranges. The meter has automatic zero correction but there may be small residual error not exceeding 5pA at 25°C. Where absolute readings are required on low ranges this small error may be subtracted from the reading obtained.
JEOL SEM Motorised objective aperture holder
The motorised unit completely replaces the existing final aperture assembly and utilises the existing aperture strip. The system comprises a precision motorised mechanical assembly, drive electronics and keypad controller.
Deben can supply a TV chamberscope for your SEM using an internally or externally mounted high resolution camera with infra-red illumination. The chamberscope can be mounted on any available free port, even one not directly in line with the centre of the column. There is a choice of wide or narrow angle lenses which are user interchangable. Systems are available with or without monitors and with optional USB control and image display. Deben chamberscopes are available for most SEM models, contact us for a quotation and to check compatibility on your SEM.
Beam Blanking for SEMs
The Deben PCD Beam Blanker has been designed to provide JEOL and Hitachi FEG, LaB6 and tungsten SEMs with the capability of blanking, pulsing or otherwise modulating the electron beam. The blanking unit utilises the PCD port on the side of the column (opposite the final aperture) and will operate at up to 30KV with a switch on/off time of approximately 50nS. There is an integral faraday cup and probe current detector for an indication of probe current. A BNC connector is provided for connection to an optional probe current meter should a more accurate reading be required.
Forensic comparison stage
The comparison stage is designed to accept the most common bullets and cartridge cases and allows two samples to be mounted side by side for detailed comparison. Each sample can be independently rotated through 360 degrees and their relative heights adjusted.
CT500 500N in-situ tensile stage for µXCT applications
In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Tescan/XRE, Nikon, Thermo Fisher Scientific and Waygate/GE we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Tansi.